10.14489/td.2019.02.pp.044-050

2019, 02 February

DOI: 10.14489/td.2019.02.pp.044-050

Artemiev B. V., Artemyev I. B., Vladimirov L. V., Vlasov A. I.
MONITORING OF NON-DESTRUCTIVE TESTING SYSTEMS IN FACTORIES
(pp. 44-50)

Abstract. The article describes the principles of building and the experience of longterm operation of remote control systems for non-contact X-ray thickness gauges installed at metal-lurgical plants for the processing of non-ferrous metals. The main attention is paid to the structure and options for the organization of a remote monitoring system for the state of devices, which made it possible to significantly reduce the downtime of measuring equip-ment and, at the same time, to reduce material costs for repairs and technical support of products.

Keywords: monitoring and control, measuring equipment, X-ray thickness measurement, diagnostics, remote maintenance.

+ - About the Authors Click to collapse

B. V. Artemiev (Bauman MSTU, Moscow, Russia; JSC RII “Spectrum”, Moscow, Russia) E-mail: Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.
I. B. Artemyev (Bauman MSTU, Moscow, Russia) E-mail: Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.
L. V. Vladimirov (JSC RII “Spectrum”, Moscow, Russia) E-mail: Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.
A. I. Vlasov (Bauman MSTU, Moscow, Russia) E-mail: Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.

+ - References Click to collapse

1. Artem'ev B. V. (2009). X-ray thickness gauges. Kontrol'. Diagnostika, (4), pp. 22-25. [in Russian language]
2. Artem'ev B. V., Bukley A. A. (2011). X-ray inspection. Moscow: ID «SPEKTR». [in Russian language]
3. Artem'ev B. V. (2002). X-ray thickness measurement of metals. Moscow: Mashinostroenie. [in Russian language]
4. Artem'ev B. V., Maslov A. I. (2006). Possibilities of multielectrode heterogeneous ionization chambers for X-ray thickness measurement. Defektoskopiya, (5), pp. 80-86. [in Russian language]
5. Artem'ev B. V., Vladimirov L. V., Maslov A. I. et al. (2002). X-ray transparent ionization. Ru Patent No. 2194332. Russian Federation. [in Russian language]
6. Artem'ev B. V., Bobrov A. P., Mirosh Yu. M. et al. (2002). Ionization chamber. Ru Patent No. 2194333. Russian Federation. [in Russian language]
7. Kanter B. M., Artem'ev I. B., Vladimirov L. V. et al. (2016). Passage ionization chamber. Ru Patent No. 163274. Russian Federation. [in Russian language]
8. Zapuskalov V. G., Artem'ev B. V., Potapov V. N. et al. (2002). X-ray rental meter. Ru Patent No. 2221220. Russian Federation. [in Russian language]
9. Klyuev V. V., Artem'ev B. V., Artem'ev I. B., Klyuev Z. V. (2012). X-ray thickness measurement in the rolling production of non-ferrous metals. Izvestiya vysshih uchebnyh zavedeniy. Mashinostroenie, 664(7), pp. 67-78. [in Russian language]

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