Журнал Российского общества по неразрушающему контролю и технической диагностике
The journal of the Russian society for non-destructive testing and technical diagnostic
 
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18 | 11 | 2024
2020, 07 July

DOI: 10.14489/td.2020.07.pp.048-052

Danilevich S. B., Tretyak V. V.
INFLUENCE OF MEASUREMENT ERROR DISTRIBUTION THE ACCURACY RATES OF THE CONTROL
(pp. 48-52)

Abstract. The influence of the type of distribution of measurement error and measurement uncertainty on the reliability of the multiparameter measurement testing is studied. Indicators of testing reliability include the probability of a control error of type 2 (P2), as well as the risk of the customer Rз and the risk of the manufacturer Rп. These control reliability indicators were calculated for different values of measurement uncertainty. The study was performed using the Monte Carlo method (imitation modelling). Three models of measurement error distribution were used: normal distribution, triangular (Simpson) distribution, uniform distribution. The results obtained allow us to establish the measurement uncertainty that provides the required risk of the customer (or another indicator of reliability). The following was established. For the symmetric law of error distribution, the highest estimates of the reliability indicators take place with a uniform distribution of the measurement error. The probability of P2 is weakly dependent on the number of controlled parameters and the type of distribution of the measurement error, but it significantly depends on the accuracy of measurements. The customer's risk depends significantly on both the number of controlled parameters and the accuracy of measurements during control.

Keywords: reliability of testing, imitation modelling, distribution of measurement error, uncertainty of measurement.

S. В. Danilevich (Novosibirsk Branch of Academy of Standardization, Metrology and Certification; Novosibirsk State Technical University, Novosibirsk, Russia) E-mail: Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.
V. V. Tretyak (Novosibirsk State Technical University, Novosibirsk, Russia) E-mail: Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.

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6. Savel'kaev S. V., Danilevich S. B. (2020). Methods and Tools for Simulation and Quality Control of Design and Production of Microwave Devices. Monograph. Cambridge: Cambridge Scholars Publishing. Lady Stephenson Library, Newcastle upon Tyne.
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