DOI: 10.14489/td.2021.08.pp.036-042

Shilin A. N., Mac B. V., Kuznetsova N. S.
OPTICAL-ELECTRONIC INSTRUMENT FOR MEASURING THE RADIATION COEFFICIENT AND TEMPERATURE OF THE CONTROLLED OBJECT
(pp. 36-42)

Abstract. The operating principle of optoelectronic instruments for measuring the temperature of the heated products based on the measurement of the radiation flux from the heated product, which depends on the temperature and emissivity of the surface material. The main error of such optocal-electronic devices is the methodological component, which is due to the variability of the radiation coefficient of the surface of the product material. The radiation coefficient of an object depends on the material, the surface state of the material, and the temperature. In the measurement process, it is difficult to take this dependence into account, since there are no exact analytical expressions of these dependencies. In practice, the radiation coefficient of the surface of material the product is determined approximately using reference books. For a more accurate determination of the radiation coefficient, a preliminary study is necessary, which requires more complex equipment than a device for measuring the radiation flux from a heated body. To solve this problem, there are empirical generalized equations of the functional dependences of the radiation coefficient. The article analyzes the errors in determining the radiation coefficient using generalized equations in comparison with experimental data. The analysis indicates that the error in determining the radiation coefficient can reach large values that may not meet the requirements of consumers. To improve the accuracy of measuring the temperature of the object, a device has been developed that implements the method of sample signals. The developed device predetermines the radiation coefficient of the measured product at a certain temperature and introduces a correction when measuring the temperature.

Keywords: radiation from heated bodies, radiation coefficient, pyrometry, optocal-electronic devices, errors of optocal-electronic devices.