10.14489/td.2023.08.pp.058-062

2023, 08 August

DOI: 10.14489/td.2023.08.pp.058-062

Matveev V. I.
METROLOGY WITHOUT BORDERS 2023
(pp. 58-62)

Abstract. The content of the International Metrology Forum dedicated to the next World Metrology Day and the accompanying exhibition is briefly described. The main topics of the business program were the improvement of the level of metrological measurements, the development of standardization systems and product certification. The exhibition demonstrated modern metrological measuring instruments and product certification produced by leading enterprises of the industry.

Keywords: forum and exhibition, metrology, standardization, certification, exemplary measuring instruments, leading enterprises.

+ - About the Authors Click to collapse

V. I. Matveev (JSC Research Institute of Introscopy MNPO “Spectrum”, Moscow, Russia) E-mail: Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.

+ - References Click to collapse

1. Dubovoy N. D., Portnov E. M. (2019). Fundamentals of metrology, standardization and certification. Ramenskoe: FORUM. [in Russian language]
2. Matveev V. I. (2018). Accurate measurements are the basis of quality and safety. Mir izmereniy, (3), pp. 54 – 57. [in Russian language]

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