2014, 08 August | |
DOI: 10.14489/td.2014.08.pp.067-074
Makhov V.E., Repin O.S., Potapov A.I. Abstract. The study of algorithms automated calibration optoelectronic measuring systems with matrix photo detectors on a bar less frames, in-cluding on the basis of algorithms for determining the coefficients of the maxima of the continuous wavelet transform (CWT). The results of field studies and modeling algorithms measuring linear bar measures using different types of wavelets. It is shown that the wavelet centers Mexican Hat detects touches measures that conforms metrological certification of optical measuring systems. Studies have shown that the use of algorithms CWT allows calibration of optoelectronic measuring systems locally to the image field dashed measures in 0.1 pixel, which is 10 times higher than the accuracy of measurement method combining with the touch of a viewfinder. Keywords: optoelectronic measuring system, the continuous wavelet transform, CWT, linear measure, object micrometer.
V. E. Makhov O. S. Repin, A. I. Potapov
1. Trevis Dzh., Kring Dzh. (2011). LabVIEW for eve-ryone. (4th (Revised and Supplemented) ed.). Moscow: DMK Press.
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