10.14489/td.2014.09.pp.049-054

2014, 09 September

DOI: 10.14489/td.2014.09.pp.049-054

Krasnov M.I., Ogurtsov A.A.
EQUIPMENTS FOR FPGA FUNCTIONAL TEST
(pp. 49-54)

Abstract. In the article we provided an overview of the modern equipment, allowing to carrying out FPGA functional test. Authors describe the main characteristics of the equipment allowing to carry out functional test for modern FPGA. The article considers the world’s major manu-facturers of automatic test equipments (ATE) available in the Russian market, authors cite the advantages and drawbacks of this equipment as applied to the FPGA functional test. The article authors proposing solutions for optimization the FPGA functional test, also authors offering to conduct FPGA functional test on the specialized stands, implementing testing using algorithms for functional FPGA test. According to the authors, application of specialized functional control stands will improve the efficiency detection of functional failures, as well as reduce the cost and time spent on the functional FPGA test.

Keywords: automatic test equipments (АТЕ), field-programmable gate array (FPGA), functional control FPGA, equipments for functional test.

+ - About the Authors Click to collapse

M. I. Krasnov, A. A. Ogurtsov
JSC “Russian Space Systems”, Russia, Moscow, Russia. E-mail Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.

+ - References Click to collapse

1. Teradayne Announcer the 500th Customer for the INTEGRA J750 Test System. (2000). EE News. Taipei, Tai-wan: Evalution Engineering online 2000.
2. Control measuring system for functional control LSI and IC tester Formula-2k. (2005). Moscow.
3. Yonct A. Eracar, Teresa Lopes. (2010). Mission As-surance through, Test Program Set Analysis.
4. Challapalli S., Chu M., Kuo A. et al. (2000). Tera-dyne’s Aurora Project. Massachusetts Institute of Technolo-gy (MIT). Boston MA.
5. Wang Laung-Terng, Wu Cheng-Wen, Wen Xiaoqing. (2007). VLSI Test Principles and Architectures.
6. Hardware Specifications J750. (2009).
7. Wang Laung-Terng. Stroud Charles E. Touba. (2008). Nur. System-on-Chip. Test. Architectures.
8. Description type of measurement means. System in-strumentation VLSI Testers FORMULA HF3. Certificate No. 48039 approval of measuring instruments type. Available at: www.form.ru/rar/doc/FHF3_TypeDesc_v2.pdf.

+ - Purchase digital version of a single article Click to collapse

This article is available in electronic format (PDF).

The cost of a single article is 250 rubles. (including VAT 18%). After you place an order within a few days, you will receive following documents to your specified e-mail: account on payment and receipt to pay in the bank.

After depositing your payment on our bank account we send you file of the article by e-mail.

To order articles please fill out the form below: