10.14489/TD.2014.02.PP.024-031

2014, 02 February

DOI: 10.14489/TD.2014.02.PP.024-031

Artem'ev B.V., Shubochkin A.E.
RESEARCH AND DEVELOPMENT OF X-RAY THICKNESS GAUGES, METHODS OF CONTROL AND MEASUREMENT ASSURANCE
(pp. 24-31)

Abstract. The article discusses the physical principles of X-ray thickness gauges for metals with an arbitrary value of the effective atomic number. The calculated and experimental measurement signal depends on the energy of the radiation, the thickness of the test object with a correction for the chemical composition of the material. Given a block diagram of the algorithm of the X-ray thickness gauge RIT10-6. Detail the process calibration. A system diagnostics and gather statistics about failures and faults integrated into the RT. An roll passport containing information about gage, date and time of release, the length of the roll, room and workshop teams to manufacture this car formed at the end of the process rolling.

Keywords: X-ray inspection, thickness measurement, X-ray thickness measurement.

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Artem'ev B.V., Shubochkin A.E.
Closed Joint-Stock Company "Research Institute of Introscopy of MSIA "Spectrum", Moscow, Russia. E-mail: Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.

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1. Artem'ev B. V. (2002). X-ray thickness gauging of metals. Moscow: Mashinostroenie.
2. Artem'ev B. V., Maslov A. I. (2006). Opportunities of multielectrode heterogeneous ionization chambers for x-ray thickness gauging. Defektoskopiia, (5), pp. 80-86.
3. Artem'ev B. V. (2009). X-ray thickness gauges. Kontrol'. Diagnostika, (4), pp. 22-25.
4. Artem'ev B. V., Buklei A. A. (2011). X-ray inspection. Moscow: Izdatel'skii dom "Spektr".
5. Artem'ev B. V., Maslov A. I., Potapov V. N., Vedernikov M. B. (2003). Implementation of x-ray thickness gauges in the production of rolled non-ferrous metals. Defektoskopiia, (6), pp. 55-61.
6. Maslov A. I., Artem'ev B. V., Zapuskalov V. G. et al. (2004). X-ray measuring device for the parameters of the rolled metal alloy. Patent on Invention No. RUS 2257543. Russian Federation.
7. Artem'ev B. V., Egorov I. V., Zapuskalov V. G. et. al. (2000). X-ray thickness gauge. Patent on Invention No. RUS 2172930. Russian Federation.
8. Artem'ev B. V., Vedernikov B. G., Egorov I. V. et. al. (2000). X-ray thickness gauge. Patent on Invention No. RUS 2159408. Russian Federation.
9. Maslov A. I., Zapuskalov V. G., Egorov I. V. X-ray thickness gauge. Patent on Invention No. RUS 2189008. Russian Federation

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DOI: 10.14489/TD.2014.02.PP.024-031

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