10.14489/td.2018.03.pp.058-063

2018, 03 March

DOI: 10.14489/td.2018.03.pp.058-063

Barsukov V. K., Sibgatullin B. I.
QUALITY CONTROL OF TANTALUM CHIP CAPACITORS BY USING SURGE CURRENT TEST
(pp. 58-63)

Abstract. The surge current method for testing tantalum capacitors as a way to increase their reliability in circuits with low resistance is proposed. The method is based on well-known test methods, regulated by international standards. Particular attention is paid to the parameters of the test bench. In particular, the resistance of the test bench is limited to the range in which changes of the inductance of the circuit and the parameters of the test capacitors have a minimal effect on the test conditions. The inductance of the test bench is maintained at a level at which the transients during the tests are aperiodic. Tests of the pilot batch of tantalum chip capacitors have been carried out. All capacitors that passed the surge current test were found to be suitable for longterm fail-safe tests. The proposed methodology can be included in the standards and specifications for capacitors. Surge current tests should be part of a set of technological measures to monitor the quality of tantalum capacitors.

Keywords: tantalum capacitor, surge current tests, reliability, reproducibility of tests, transient processes.

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V. K. Barsukov, B. I. Sibgatullin (Kalashnikov Izhevsk State Technical University, Izhevsk, Russia) E-mail: Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра. Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра. , Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра. Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.

+ - References Click to collapse

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